Repozitorij istraživačkih podataka Instituta Ruđer Bošković
The dual ion beam microprobe Imaging of Organic Samples with Megaelectron Volt Time-of-Flight Secondary Ion Mass Spectrometry Capillary Microprobe Low energy MeV SIMS yield measurements of various inorganic samples Development of MeV TOF-SIMS capillary microprobe at the Ruder Boskovic Institute in Zagreb Implantation site design for large area diamond quantum device fabrication MeV TOF SIMS determination of deposition order between optically distinguishable and indistinguishable inks Chemical imaging of organic materials with MeV SIMS using a continuous collimated ion beam Dependence of MeV TOF SIMS secondary molecular ion yield from phthalocyanine blue on primary ion stopping power 
